Professor Jon Goff (Royal Holloway University of London)

Wed 23 October, 3:30-4:30pm in Shilling-LT (Electrical Engineering)

Our speaker and colleague, Prof. Jon Goff (Royal Holloway University of London), will discuss results from the Royal Holloway X-ray Lab, including x-ray diffraction and reflectivity techniques used to investigate thin films and materials. The talk will highlight methods that apply to diverse scientific problems and encourage collaboration. 


Abstract
Structures from soil to superconducting qubits 
In this talk I shall review results from the first year of operation of the Royal Holloway X-ray Lab. Powder x-ray diffraction has been used for phase identification in soils and for materials synthesis, with structure determination using Rietveld refinement. Thin film thickness, interfacial roughness and layer density has been measured using x-ray reflectivity for spintronic and superconducting thin films, and the crystallinity of these layers has been investigated using grazing-incidence x-ray diffraction. The epitaxial structures of spintronic and 2D electron gas films and multilayers have been determined using high-resolution high-angle scattering. There is considerable overlap in the approach to very different scientific problems, and it is hoped that by sharing good practice we can learn from each other’s experience and encourage new users.

Professor Jon Goff's Laboratory